NI Apps's video: Power Semiconductor Rollercoaster: Dynamic H3TRB

@Power Semiconductor Rollercoaster: Dynamic H3TRB

In this video, Gabriel Lieser, Head of Power Semiconductor Reliability Research at NI, focuses on the dynamic H3TRB (High Humidity High Temperature Reverse Bias), a reliability test for wide bandgap components made of SiC or GaN. It is similar to the DRB test, but humidity is added through a climate chamber, which brings new challenges in the test setup and causes other failure mechanisms. The dynamic H3TRB test is an important test for wide-bandgap power semiconductors to test their reliability close to the application. Learn more: https://bit.ly/3VYQfFs

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This video was published on 2024-06-28 19:02:52 GMT by @NI-Apps on Youtube. NI Apps has total 42.1K subscribers on Youtube and has a total of 235 video.This video has received 0 Likes which are lower than the average likes that NI Apps gets . @NI-Apps receives an average views of 5.7K per video on Youtube.This video has received 0 comments which are lower than the average comments that NI Apps gets . Overall the views for this video was lower than the average for the profile.

NI Apps's video: Power Semiconductor Rollercoaster: Dynamic H3TRB

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